Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference34 articles.
1. Integrating an electron-beam system into VLSI fault diagnosis;Tamana,1986
2. Integrated electron beam measurement system for automated chip verification;Geiger,1987
3. Computer control of electron beam testing for design validation of VLSI circuit;Ranasinghe,1986
4. Some aspects concerning design for e-beam testability;Herrmann;Microelectronic Engineering,1986
5. Ultra large scale integration;Meindl;IEEE Transactions on Electron Devices,1984
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