Author:
Görlich S.,Keβler P.,Plies E.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
12 articles.
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1. Electron Spectrometers and Voltage Measurements;Electron Beam Testing Technology;1993
2. Retarding-field electron energy analyzer with a two-tube adapting lens for voltage contrast;Proceedings, annual meeting, Electron Microscopy Society of America;1992-08
3. Electron beam testing versus laser beam testing;Microelectronic Engineering;1992-03
4. Advances in Voltage-Contrast Detectors in Scanning Electron Microscopes;Advances in Optical and Electron Microscopy;1991
5. Secondary electron energy analyzers for electron-beam testing;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1990-12