1. Electron-beam cell-projection lithography system
2. H. Kawano, H. Ito, T. Matsuzaka, N. Saitou, H. Oota, Y. Sohda, to be published in Proceedings of the 46th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication.
3. Y. Sohda, H. Itoh, Y. Someda, Y. Nakayama, H. Satoh, G. Matsuoka, Japanese patent P3274212.
4. New detection method for the 2-dimensional beam shape