Atomic Structure and Properties of Dislocations and Grain Boundaries-Reference-Cited by-同舟云学术

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Atomic Structure and Properties of Dislocations and Grain Boundaries

Published:2016 Issue: Volume: Page:
ISSN:
Container-title:Reference Module in Materials Science and Materials Engineering
language:
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Author:

Pennycook S.J.,Duscher G.,Buczko R.,Kim M.,Browning N.D.,Zhou W.,Li C.,Pennycook T.J,Ishikawa R.,Pantelides S.T.

Publisher

Elsevier

Reference125 articles.

1. Carrier recombination at single dislocations in GaN measured by cathodoluminescence in a transmission electron microscope;Albrecht;Journal of Applied Physics,2002

2. EBIC and IBIC imaging on polycrystalline CdTe;Baier;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment,2007

3. Simultaneous STEM imaging and electron energy-loss spectroscopy with atomic column sensitivity;Batson;Nature,1993

4. Three-dimensional imaging of individual hafnium atoms inside a semiconductor device;van Benthem;Applied Physics Letters,2005

5. Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopy;van Benthem;Ultramicroscopy,2006

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