Secondary ion mass spectrometry
Author:
Funder
European Union
Horizon 2020
Publisher
Elsevier
Reference94 articles.
1. ToF-SIMS: Materials Analysis by Mass Spectrometry: Surface Analysis by Mass Spectrometry,2013
2. Microanalyse par émission ionique secondaire;Castaing;J. Microsc.,1962
3. Exploring the surface sensitivity of TOF-secondary ion mass spectrometry by measuring the implantation and sampling depths of Bi(n) and C60 ions in organic films;Muramoto;Anal. Chem.,2012
4. Imaging lipids with secondary ion mass spectrometry;Kraft;Biochim. Biophys. Acta,2014
5. A novel ToF-SIMS operation mode for sub 100 nm lateral resolution: application and performance;Kubicek;Appl. Surf. Sci.,2014
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1. Mass spectrometry imaging for spatially resolved multi-omics molecular mapping;npj Imaging;2024-07-17
2. Secondary Ion Mass Spectral Imaging of Metals and Alloys;Materials;2024-01-22
3. VAMAS TWA2 interlaboratory comparison: Surface analysis of TiO2 nanoparticles using ToF-SIMS;Journal of Vacuum Science & Technology A;2023-08-16
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