Author:
BAUER ROBERT S.,McGILL THOMAS C.
Reference114 articles.
1. “Physics and Technology of Semiconductor Devices.”;Grove,1967
2. “Characteristic electronic defects at the Si-SiO2 interface,”;Johnson;Appl. Phys. Lett.,1983
3. “Transmission electron microscopy of Au-based ohmic contacts to n-AllxGa1–xAs,”;Chang;J. Appl. Phys.,1979
4. “Alloyed ohmic contacts to GaAs,”;Braslau;J. Vac. Sci. Technol.,1981
5. “Ohmic contacts to GaAs,”;Braslau;Thin Solid Films,1983
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1. Atomic Geometry and Electronic Structure of Tetrahedrally Coordinated Compound Semiconductor Interfaces;Surface Properties of Electronic Materials - The Chemical Physics of Solid Surfaces and Heterogeneous Catalysis;1988