Characterization and Diagnosis of Silicon Wafers, Ingots, and Solar Cells-Reference-Cited by-同舟云学术

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Characterization and Diagnosis of Silicon Wafers, Ingots, and Solar Cells

Published:2012 Issue: Volume: Page:1011-1044
ISSN:
Container-title:Practical Handbook of Photovoltaics
language:
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Author:

Cuevas Andrés,Macdonald Daniel,Sinton Ronald A.

Publisher

Elsevier

Reference80 articles.

1. Lifetime spectroscopy for defect characterization: systematic analysis of the possibilities and restrictions;Rein;J. Appl. Phys.,2002

2. Capture cross sections of the acceptor level of iron-boron pairs in p-type silicon by injection-level dependent lifetime measurements;Macdonald;J. Appl. Phys.,2001

3. General parameterization of Auger recombination in crystalline silicon;Kerr;J. Appl. Phys.,2002

4. Measurement of carrier lifetimes in germanium and silicon;Stevenson;J. Appl. Phys.,1955

5. Photoconductivity of Solids;Bube,1960

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