Characterization and Failure Analysis of Materials and Devices-Reference-Cited by-同舟云学术

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Characterization and Failure Analysis of Materials and Devices

Published:2015 Issue: Volume: Page:611-664
ISSN:
Container-title:Reliability and Failure of Electronic Materials and Devices
language:
Short-container-title:

Author:

Ohring Milton,Kasprzak Lucian

Publisher

Elsevier

Reference42 articles.

1. Failure analysis in semiconductor devices – rationale, methodology and practice

2. The Role of Microscopy in Semiconductor Failure Analysis;Richards,1992

3. Encyclopedia of Materials Characterization,1992

4. VLSI Technology;Bindell,1988

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