Tests on the validity of the atomic column approximation for STEM probe propagation
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. A simple intuitive theory for electron diffraction
2. Annular dark-field imaging: Resolution and thickness effects
3. Thickness effects in ADF STEM zone axis images
4. Theory of Lattice Resolution in High-angle Annular Dark-field Images
5. Accurate structure determination from image reconstruction in ADF STEM
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