Thickness effects in ADF STEM zone axis images
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference39 articles.
1. Chemically sensitive structure-imaging with a scanning transmission electron microscope
2. Z-contrast stem for materials science
3. High-resolution imaging of silicon (111) using a 100 keV STEM
4. Annular dark-field imaging: Resolution and thickness effects
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