Scanning Transmission Electron Microscopy
Author:
Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-030-00069-1_2
Reference199 articles.
1. A.V. Crewe, D.N. Eggenberger, J. Wall, L.M. Welter: Electron gun using a field emission source, Rev. Sci. Instrum. 39, 576–583 (1968)
2. A.V. Crewe, J. Wall, L.M. Welter: A high-resolution scanning transmission electron microscope, J. Appl. Phys. 39, 5861–5868 (1968)
3. A.V. Crewe: The physics of the high-resolution scanning microscope, Rep. Prog. Phys. 43, 621–639 (1980)
4. L.M. Brown: Scanning transmission electron microscopy: Microanalysis for the microelectronic age, J. Phys. F 11, 1–26 (1981)
5. J.M. Cowley: Scanning transmission electron microscopy of thin specimens, Ultramicroscopy 2, 3–16 (1976)
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