Combining convergent-beam diffraction with high resolution imaging
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. New layered structure of Bi2W2O9determined by 1 MV high-resolution electron microscopy
2. Symmetry determination of the room-temperature form of LnNbO4(Ln = La,Nd) by convergent-beam electron diffraction
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Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Principles and applications of convergent beam electron diffraction: A bibliography (1938-1990);Journal of Electron Microscopy Technique;1991-01
2. Crystal structure determination of BaNd2Ti3O10 using high-resolution electron microscopy;Journal of Solid State Chemistry;1985-12
3. Convergent-beam electron diffraction from faulted crystals of ZrS3;Ultramicroscopy;1985-01
4. A comparison of techniques for obtaining convergent beam electron diffraction patterns with a JEOL 200CX;Ultramicroscopy;1982-01
5. A method of alignment for convergent beam diffraction in TEM mode for a JEM-100C electron microscope;Ultramicroscopy;1982-01
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