A method of alignment for convergent beam diffraction in TEM mode for a JEM-100C electron microscope-Reference-Cited by-同舟云学术

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A method of alignment for convergent beam diffraction in TEM mode for a JEM-100C electron microscope

Published:1982-01 Issue:4 Volume:7 Page:343-350
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Witcomb M.J.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Microdiffraction;Warren,1979

2. Defect Analysis in Electron Microscopy;Loretto,1975

3. Convergent Beam Electron Diffraction;Steeds,1979

4. The co-precipitation of vacancies and carbon atoms in quenched platinum

5. J.T. Fourie, in: Scanning Electron Microscopy/1979/II, Ed. O. Johari (AMF O'Hare, IL) p. 87.

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Principles and applications of convergent beam electron diffraction: A bibliography (1938-1990);Journal of Electron Microscopy Technique;1991-01

2. A study of precipitation in interstitial alloys—II. A new metastable carbide phase in platinum;Acta Metallurgica;1983-05

3. A comparison of techniques for obtaining convergent beam electron diffraction patterns with a JEOL 200CX;Ultramicroscopy;1982-01

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