A quantitative X-ray microanalysis thin film method using K-, L-, and M-lines
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference18 articles.
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2. Scanning Electron Microscopy;Goldstein,1977
3. Quantitative X-ray microanalysis: instrumental considerations and applications to materials science;Zaluzec,1979
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