A set of computer programs for determining defocus and astigmatism in electron images
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference20 articles.
1. Notizen: Zur Defokussierungsabhängigkeit des Phasenkontrastes bei der elektronenmikroskopischen Abbildung
2. Principles of electron structure research at atomic resolution using conventional electron microscopes for the measurement of amplitudes and phases
3. Measurement and compensation of defocusing and aberrations by Fourier processing of electron micrographs
4. The “EM” program system
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