A procedure for quantification of precipitate microstructures from three-dimensional atom probe data
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Application of a position‐sensitive detector to atom probe microanalysis
2. The tomographic atom probe: A quantitative three‐dimensional nanoanalytical instrument on an atomic scale
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4. M.K. Miller, Atom Probe Tomography: Analysis at the Atomic Level, Klumer Academic/Plenum Publishers, New York, 2000, p. 159.
5. D. Wolde Giorgis, T. Al-Kassab, R. Kirchheim, Ultramicroscopy, this proceeding.
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