Spatial resolution in x-ray microanalysis of thin foils in stem
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. Improved spatial resolution microanalysis in a scanning transmission electron microscope
2. On the production of X-rays in thin metal foils
3. Microanalysis of Grain Boundary Segregation in Embrittled Iron-3wt% Nickel Alloys Using STEM
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4. Analytical electron microscopy of thin segregated layers;X-Ray Spectrometry;1994-09
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