1. Proc. Symp. on X-ray Optics and X-ray Micro analysis, Stanford, 1963, p. 431.
2. and Proc. 5th Int. Conf. on X-ray Optics and Microanalysis, Tubingen, 1968, p. 246.
3. and Proc. 4th Int. Conf. on Electron Probe Microanalysis, Pasadena 1969, p. 64.
4. The quantitative analysis of thin specimens
5. Electron Probe Microanalysis, Cambridge University Press, 1974, p. 327.