1. IR imaging of integrated circuit power transistors during operation;Wang;Proc. SPIE,2002
2. Remote temperature mapping of high-power InGaN/GaN MQW flip-chip design LEDs;Malyutenko;Proc. SPIE,2005
3. Improved row action iterative super-resolution restoration for thermal microscope imaging system;Gao;Opto-Electron. Eng.,2011
4. Mathematics theory and realization of aliasing reduction in opto-electric imaging system using microscanning;Zhang;Acta Optica Sinica,1999
5. Quantitative analysis of aliasing effects in opto-electric imaging systems;Zhang;Acta Optica Sinica,1999