Reliability prediction for microelectronic systems-Reference-Cited by-同舟云学术

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Reliability prediction for microelectronic systems

Published:1985-01 Issue:3 Volume:10 Page:129-140
ISSN:0143-8174
Container-title:Reliability Engineering
language:en
Short-container-title:Reliability Engineering

Author:

O'Connor Patrick D.T.,Head Michael G.,Joy Malcolm

Publisher

Elsevier BV

Subject

General Engineering

Reference5 articles.

1. Reliability prediction for electronic systems. US Military Handbook 217D.

2. RADC failure rate prediction methodology today and tomorrow;Manno,1982

3. Microelectronics system reliability prediction;O'Connor;IEEE Trans. Reliability,1983

4. Dey, K.A. Correlation of field data with reliability prediction models. Report RADC-TR-81ndash;329

5. Failure mode and effect analysis. US Military Handbook 1629.

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A reliability model for a wafer FAB;Cogent Engineering;2017-01-01

2. Physics-of-Failure based Reliability Engineering;Applied Reliability Engineering and Risk Analysis;2013-08-23

3. Reliability prediction system based on the failure rate model for electronic components;Journal of Mechanical Science and Technology;2008-05

4. Novel concepts for reliability technology;Microelectronics Reliability;2005-03

5. Failure modes and effects analysis — Bibliography;Microelectronics Reliability;1992-05

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