A reliability model for a wafer FAB-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

A reliability model for a wafer FAB

Published:2017-01-01 Issue:1 Volume:4 Page:1340817
ISSN:2331-1916
Container-title:Cogent Engineering
language:en
Short-container-title:Cogent Engineering

Author:

Jang Joong S.¹,Park Sang C.¹

Affiliation:

1. Department of Industrial Engineering, Ajou University, San 5, Woncheon-dong, Yeongtong-gu, Suwon, Korea

Funder

Agency for Defense Development

National Research Foundation of Korea

Ministry of Land, Infrastructure and Transport of the Korean Government

MSIP/IITP

Ministry of Education, Science and Technology

Publisher

Informa UK Limited

Subject

General Engineering,General Chemical Engineering,General Computer Science

Link

https://www.cogentoa.com/article/10.1080/23311916.2017.1340817.pdf

Reference34 articles.

1. Fast mission reliability prediction for Unmanned Aerial Vehicles

2. A survey of reliability-prediction procedures for microelectronic devices

3. Capacity planning with capability for multiple semiconductor manufacturing fabs

4. Due date control in order-driven FAB with high priority orders

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A quantitative and qualitative study of life cycle costing in defense projects and programs;Management Review Quarterly;2024-04-11

2. Demand fulfillment and availability analysis of a multi-state production system considering spare part inventory policy;Cogent Engineering;2024-04

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP