New carbon nanotube AFM probe technology
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference6 articles.
1. Atomic Force Microscope
2. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
3. Growth of nanotubes for probe microscopy tips
4. Carbon nanotube tip probes: stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors
5. Imaging artefacts in atomic force microscopy with carbon nanotube tips
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