Artifacts in T1ρ-weighted imaging: correction with a self-compensating spin-locking pulse
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,Nuclear and High Energy Physics,Biochemistry,Biophysics
Reference25 articles.
1. Proton T1ρ-dispersion imaging of rodent brain at 1.9T;Rizi;J. Magn. Reson. Imaging,1998
2. On- and off-resonance spin-lock MR imaging of normal human brain at 0.1T: possibilities to modify image contrast;Ramadan;Magn. Reson. Imaging,1998
3. T1ρ imaging of murine brain tumors at 4T;Poptani;Acad. Radiol.,2001
4. Determination of T1ρ values for head and neck tissues at 0.1T: a comparison to T1 and T2 relaxation times;Markkola;Magn. Reson. Imaging,1998
5. T1ρ dispersion imaging of head and neck tumors: a comparison to spin lock and magnetization transfer techniques;Markkola;J. Magn. Reson. Imaging,1997
Cited by 96 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Novel spin‐lock time sampling strategies for improved reproducibility in quantitative T1ρ mapping;NMR in Biomedicine;2024-08-17
2. Cartilage compositional MRI—a narrative review of technical development and clinical applications over the past three decades;Skeletal Radiology;2024-07-09
3. Neuronal current imaging of epileptic activity: An MRI study in patients with a first unprovoked epileptic seizure;Epilepsia Open;2024-07-06
4. Rotary excitation of non‐sinusoidal pulsed magnetic fields: Towards non‐invasive direct detection of cardiac conduction;Magnetic Resonance in Medicine;2024-06-27
5. Quantification of the rotating frame relaxation time T2ρ: Comparison of balanced spin‐lock and continuous‐wave Malcolm‐Levitt preparations;NMR in Biomedicine;2024-06-24
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3