Channel Current Model With Real Device Effects in BSIM-IMG

Author:

Khandelwal Sourabh

Publisher

Elsevier

Reference9 articles.

1. Mosfet carrier mobility model based on gate oxide thickness, threshold and gate voltages;Chen;Solid State Electron.,1996

2. BSIM-IMG: a compact model for ultrathin-body SOI MOSFETs with back-gate control;Khandelwal;IEEE Trans. Electron Devices,2012

3. New mobility model for accurate modeling of transconductance in FDSOI MOSFETs,”;Lin;IEEE Trans. Electron Devices,2018

4. Multigate transistors as the future of classical metal-oxide-semiconductor field-effect transistors;Ferain;Nature,2011

5. Y.K. Choi, et al., 30 nm ultra-thin-body SOI MOSFET with selectively deposited Ge raised S/D. in: 58th DRC. Device Research Conference. Conference Digest (Cat. No. 00TH8526). IEEE, 2000.

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3