Comparative analysis of NBTI modeling frameworks BAT and Comphy
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference12 articles.
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5. Mitani Y. Influence of nitrogen in ultra-thin SiON on negative bias temperature instability under AC stress. In: IEDM Technical digest. IEEE International electron devices meeting, 2004. 2004, p. 117–20. http://dx.doi.org/10.1109/IEDM.2004.1419082.
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