Author:
Kwon Sung-Kyu,Kwon Hyuk-Min,Choi Woon-Il,Song Hyeong-Sub,Lee Hi-Deok
Funder
Chungnam National University
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference15 articles.
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3. Bok JD, Han IS, Kwon HM, Park SU, Jung YJ, Park SH, Choi WI, Ha ML, Lee JI, Lee HD. Decoupling of RTS noise in high density CMOS image sensor using new test structures. Microelectronic Test Structures (ICMTS), IEEE Int Conf, 2011. p. 87–9.
4. Decrease of dark current by reducing transfer transistor induced partition noise with localized channel implantation;Park;IEEE Electron Device Lett,2010
5. A COMS image sensor with in-pixel buried-channel source-follower and optimized row selector;Chen;IEEE Electron Device Lett,2009
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