Monte Carlo analysis of the dynamic behavior of III–V MOSFETs for low-noise RF applications

Author:

Shi Ming,Saint-Martin Jérôme,Bournel Arnaud,Querlioz Damien,Wichmann Nicolas,Bollaert Sylvain,Danneville François,Dollfus Philippe

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference45 articles.

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