Comparing smoothing techniques for extracting MOSFET threshold voltage-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Comparing smoothing techniques for extracting MOSFET threshold voltage

Published:2020-02 Issue: Volume:164 Page:107744
ISSN:0038-1101
Container-title:Solid-State Electronics
language:en
Short-container-title:Solid-State Electronics

Author:

Stankus Christopher,Ahmed Moinuddin

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Revisiting MOSFET threshold voltage extraction methods;Ortiz-Conde;Microelectron Reliab,2013

2. Semiconductor material and device characterization;Schroeder,2006

3. Basic mechanisms of threshold-voltage instability and implications for reliability testing of SiC MOSFETs;Lelis;IEEE Trans Electron Dev,2015

4. New method for the extraction of mosfet parameters;Ghibaudo;Electron Lett,1988

5. gm/Id method for threshold voltage extraction applicable in advanced MOSFETs with nonlinear behavior above threshold;Flandre;IEEE Electron Device Lett,2010

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Rapid MOSFET threshold voltage testing for high throughput semiconductor process monitoring;2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS);2024-04-15

2. Total ionizing dose effect modeling method for CMOS digital-integrated circuit;Nuclear Science and Techniques;2024-02

3. Not the LAAST word, a response to Liebl's critique;Gait & Posture;2022-02

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP