1. CMOS device design-in reliability approach in advanced nodes;Huard;2009 IEEE IRPS,2009
2. Two independent components modeling for negative bias temperature instability;Huard;2010 IEEE IRPS,2010
3. Paramagnetic point defects in amorphous thin films of SiO2 and Si3N4: updates and additions;Poindexter;J Electrochem Soc,1995
4. A two-stage model for negative bias temperature instability;Grasser;2009 IEEE IRPS,2009
5. NBTI: an atomic-scale defect perspective;Campbell;2006 IEEE IRPS,2006