Investigation on Realistic Stuck-on/off Defects to Complement IEEE P2427 Draft Standard
Author:
Affiliation:
1. University of Verona,Department of Computer Science,Italy
2. Sydelity B.V.,Kruisem,Belgium
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9806045/9806137/09806269.pdf?arnumber=9806269
Reference21 articles.
1. SPICE-based mixed-mode S-parameter calculations for four-port and three-port circuits
2. Dealing with Uncertainties in Analog/Mixed-Signal Systems
3. Parametric fault simulation and test vector generation
4. Using Mixed-Signal Defect Simulation to Close the Loop Between Design and Test
5. Analog transient concurrent fault simulation with dynamic fault grouping
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1. Improving Efficiency of Cell-Aware Fault Modeling By Utilizing Defect-Free Analog Simulation;2023 International Symposium of Electronics Design Automation (ISEDA);2023-05-08
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