Analysis of burn-in time using the general law of reliability-Reference-Cited by-同舟云学术

Analysis of burn-in time using the general law of reliability

Published:2002-12 Issue:12 Volume:42 Page:1967-1974
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Baskin E.M

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference24 articles.

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2. Representation of distributions having monotone or bathtub-shaped failure rates;Griffith;IEEE Trans. Reliab. R,1982

3. Modeling discrete bathtub and upside-down bathtub mean residual-life functions;Guess;IEEE Trans. Reliab. R,1988

4. A new model for a lifetime distribution with bathtub shaped failure rate;Haupt;Microelectron. Reliab.,1992

5. A reliability distribution with increasing decreasing constant and bathtub-shaped failure rates;Hjorth;Technometrics,1980

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