Author:
Dammann M.,Chertouk M.,Jantz W.,Köhler K.,Weimann G.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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5. Effect of drain voltage on channel temperature and reliability of pseudomorphic InP-based HEMTs
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