Design error diagnosis in digital circuits with stuck-at fault model-Reference-Cited by-同舟云学术

Design error diagnosis in digital circuits with stuck-at fault model

Published:2000-02 Issue:2 Volume:40 Page:307-320
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Jutman A.,Ubar R.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. Multiple design error diagnosis and correction in digital VLSI circuits;Veneris,1999

2. Hoffmann DW, Kropf T. Using BDD-based decomposition for automatic error correction in combinatorial circuits. Technical Report, University of Karlsruhe, available at http://goethe.ira.uka.de/∼hoff.

3. ErrorTracer: a fault simulation based approach to design error diagnosis;Huang,1997

4. Incremental logic rectification;Huang,1997

5. Connection errors location and correction in combinational circuits;Wahba,1997

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