1. M. Aarna, E. Ivask, A. Jutman, E. Orasson, J. Raik, R. Ubar, V. Vislogubov, H.D. Wuttke. “Turbo Tester — Diagnostic Package for Research and Training,” in Scientific-Technical Journal “Radioelectronics & Informatics”. KN U RE. Vol. 3(24), 2003, pp.69–73.
2. IEEE European Test Workshop;M Blyzniuk,2000
3. M.L. Bushnell, V.D. Agrawal, Essentials of Electronic Testing for Digital Memory and Mixed-Signal Circuits, Kluwer Academic Publishers, Dordrecht: 2000, p. 690.
4. IEEE Int. Symp. on Defect and Fault Tolerance in VLSI Systems;G Jervan,2000
5. A. Jutman, R. Ubar, “Design Error Diagnosis in Digital Circuits with Stuck–at Fault Model,” Journal of Microelectronics Reliability. Pergamon Press, Vol. 40, No 2, 2000, pp.307–320.