Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference49 articles.
1. Junction lasers which operate continuously at room temperature;Hayashi;Appl. Phys. Lett,1970
2. Alferov ZhI, Andreef VM, Garbutov DZ, Zhilyaev YuV, Morozov EP, Portnoi EL, Trofim VG. Sov Phys Semicond 1971;4:1573. (Translated from Fiz Tekh Poluprovodn 1970;4:1826)
3. Semiconductor device reliability,1990
4. Fukuda M. Reliability and degradation of semiconductor lasers and LEDs Boston: Artech House, 1991; Fukuda M. Optical semiconductor devices New York: Wiley, 1999
5. Fantini F, Liou JJ, Fukuda M, (Editors) Reliability of compound semiconductor devices and integrated circuits, microelectronics and reliability, New York: Pergamon Press, vol. 39, No. 9, 1999
Cited by
15 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献