Reliability of optoelectronics-Reference-Cited by-同舟云学术

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Reliability of optoelectronics

Published:2015 Issue: Volume: Page:83-114
ISSN:
Container-title:Reliability Characterisation of Electrical and Electronic Systems
language:
Short-container-title:

Author:

Huang J.-S.

Publisher

Elsevier

Reference89 articles.

1. ULSI Technology;Chang,1996

2. Reliability of etched-mesa buried-heterostructure semiconductor lasers;Huang;IEEE Trans. Device Mater. Reliab.,2005

3. Cramming more components onto integrated circuits;Moore;Electron. Mag.,1965

4. Haitz’s law;Haitz;Nat. Photonics,2007

5. November 17–December 23, 1947: Invention of the First Transistor;American Physical Society,1947

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1. Reliability challenges of nanoscale avalanche photodiodes;MOJ Solar and Photoenergy Systems;2017-12-21

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