Author:
Haddab Y.,Manic D.,Popovic R.S.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference4 articles.
1. Shimura, F., in Oxygen in Silicon, Vol. 42. Academic Press Inc., London, 1994
2. 'Border traps' in MOS devices
3. Precipitation of oxygen in dislocation-free silicon
Cited by
3 articles.
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