Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Cosmic Radiation as a Cause for Power Device Failure and Possible Countermeasures;Kabza,1994
2. Analysis of GTO Failure Mode during DC Voltage Blocking;Matsuda,1994
3. Cosmic Ray Induced Breakdown in High Voltage Semiconductor Devices, Microscopic Model and Phenomenological Lifetime Prediction;Zeller,1994
4. The effect of sea level cosmic rays on electronic devices;Ziegler;J. Appl. Phys.,1981
5. W.R. McKee, H.P. McAdams, E.B. Smith, J.W. McPherson, J.W. Janzen, J.C. Ondrusek, A.E. Hyslop, D.E. Russell, R.A. Coy, D.W. Bergman, N.Q. Nguyen, T.J. Aton, L.W. Block, V.C. Huynh, Cosmic Ray Neutron Induced Upsets as a Major Contributor to the Soft Error Rate of Current and Future Generation DRAMs., 1996 IEEE International Reliability Physics Proceedings, IEEE Catalog No. 95CH35825
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