Cosmic ray neutron induced upsets as a major contributor to the soft error rate of current and future generation DRAMs-Reference-Cited by-同舟云学术

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Cosmic ray neutron induced upsets as a major contributor to the soft error rate of current and future generation DRAMs

Published:1996 Issue: Volume: Page:
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Container-title:Proceedings of International Reliability Physics Symposium RELPHY-96
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Author:

McKee W.R.,McAdams H.P.,Smith E.B.,McPherson J.W.,Janzen J.W.,Ondrusek J.C.,Hyslop A.E.,Russell D.E.,Coy R.A.,Bergman D.W.,Nguyen N.Q.,Aton T.J.,Block L.W.,Huynh V.C.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx2/3523/10603/00492052.pdf?arnumber=492052

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. OBET: On-the-Fly Byte-Level Error Tracking for Correcting and Detecting Faults in Unreliable DRAM Systems;Sensors;2021-12-10

2. Application-based fault tolerance techniques for sparse matrix solvers;The International Journal of High Performance Computing Applications;2017-05-10

3. Reliability of Single-Error Correction Protected Memories;IEEE Transactions on Reliability;2009-03

4. Sensing Challenges for Controls and PHM in the Hostile Operating Conditions of Modern Turbine Engine;44th AIAA/ASME/SAE/ASEE Joint Propulsion Conference & Exhibit;2008-07-21

5. References;Memory Systems;2008

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