XPS and XRR studies on microstructures and interfaces of DLC films deposited by FCVA method-Reference-Cited by-同舟云学术

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XPS and XRR studies on microstructures and interfaces of DLC films deposited by FCVA method

Published:2002-12 Issue: Volume:420-421 Page:235-240
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Park C.K.,Chang S.M.,Uhm H.S.,Seo S.H.,Park J.S.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. Hydrogen-free amorphous carbon films: correlation between growth conditions and properties

2. Diamond-like carbon: state of the art

3. Direct evaluation of the sp3 content in diamond-like-carbon films by XPS

4. Recent progress in filtered vacuum arc deposition

5. Electron‐energy‐loss spectroscopy of mass‐selected ion‐beam‐deposited diamondlike carbon

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1. Effect of bias gradient delta on mechanical and tribological properties of DLC films sputtered on ACM;Surface and Coatings Technology;2024-04

2. Monitoring of Carbonated Hydroxyapatite Growth on Modified Polycrystalline CVD-Diamond Coatings on Titanium Substrates;Crystals;2024-01-06

3. Microstructure, mechanical, and electrochemical properties of Si/DLC coating deposited on 2024-T3 Al alloy;Journal of Alloys and Compounds;2023-12

4. Effect of C2H2 flow rate and a Ti/TiN/TiCN interlayer on the structure, mechanical and tribological properties of a-C:H films deposited using a hybrid PVD/PECVD process with an anode-layer ion source;Vacuum;2023-03

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