Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. C. Pickering, in: D.T.J. Hurle (Ed.), Handbook of Crystal Growth, Elsevier, Amsterdam, 1994, p. 817.
2. Nondestructive characterization of semiconductor multilayers
3. Real‐time spectroscopic ellipsometry monitoring of Si1−xGex/Si epitaxial growth
4. C. Pickering, J. Russell, V. Nayar, et al., Thin Solid Films, this volume.
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