Optical properties and band structure of Ge1−yCy and Ge-rich Si1−x−yGexCy alloys-Reference-Cited by-同舟云学术

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Optical properties and band structure of Ge1−yCy and Ge-rich Si1−x−yGexCy alloys

Published:1998-02 Issue: Volume:313-314 Page:172-176
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Junge K.E.,Voss N.R.,Lange R.,Dolan J.M.,Zollner Stefan,Dashiell M.,Hits D.A.,Orner B.A.,Jonczyk R.,Kolodzey J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference29 articles.

1. High-Speed Silicon-Germanium Electronics

2. Optical spectra of SixGe1−xalloys

3. Spectroscopic ellipsometry characterization of strained and relaxed Si1−xGexepitaxial layers

4. Spectroscopic ellipsometry of Si1−xGexepilayers of arbitrary composition 0≤x≤0.255

5. C. Pickering, R.T. Carline, J. Appl. Phys. 75 (1994) 4642. See also C. Pickering, this volume.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optical characterization of as-prepared and rapid thermal oxidized partially strain compensated Si1−x−y GexCy films;Materials Science in Semiconductor Processing;2001-12

2. Carbon-Incorporated Alloys (SI1-x C x , SI1-x-y GE x C y , etc.);Optical Constants of Crystalline and Amorphous Semiconductors;1999

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