Author:
Pérez-Bueno J.J,Ramı́rez-Bon R,Vorobiev Y.V,Espinoza-Beltrán F,González-Hernández J
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference21 articles.
1. The Physics of SiO2 and its Interfaces;Di Maria,1978
2. R. Helms, B.E. Deal (Eds.), The Physics and Chemistry of SiO2 and Si–SiO2 interfaces, Plenum, New York NY, 1988.
3. F. Koch, A. Spitzer (Eds.), INFOS 89, Proceedings of the 6th International Conference on Insulating Films, North Holland, Amsterdam, 1989.
4. Characterization of SiO2 layers on Si wafers using atomic force microscopy
5. The effect of hydrogen on oxygen diffusion in quartz: evidence for fast proton transients?
Cited by
23 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献