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Investigation of the interfacial structure of ultra-thin platinum films using X-ray reflectivity and X-ray photoelectron spectroscopy

  • Published:2000-09 Issue:1-2 Volume:372 Page:94-103
  • ISSN:0040-6090
  • Container-title:Thin Solid Films
  • language:en
  • Short-container-title:Thin Solid Films

Author:

Solina D.M,Cheary R.W,Swift P.D,Dligatch S,McCredie G.M,Gong B,Lynch P

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference38 articles.

1. Hard x-ray mirror fabrication capabilities in Europe

2. Journal de Physique IV-Colloque C4 supplement au;Knoll;J. Phys.,1996

3. G.M. Zorn, SIEMENS X-ray Analytical Equipment, Applications Notes, No. 1194, Bruker Analytical X-ray Systems Inc., Karlsruhe, West Germany, 1994.

4. Layered synthetic X-ray mirrors: Fabrication, tests and applications

5. Layered synthetic microstructures as Bragg diffractors for X rays and extreme ultraviolet: theory and predicted performance

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