In situ ellipsometry studies of temperature-dependent Au thin-film growth
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. R.M.A. Azzam, N.M. Bashara, Ellipsometry and Polarized Light, 1st ed., North-Holland, New York, 1977, Chapter. 4.
2. Handbook of Optical Constants of Solids;Aspnes,1985
3. Effects of component optical activity in data reduction and calibration of rotating-analyzer ellipsometers
4. Microstructural Information From Optical Properties In Semiconductor Technology
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