Effect of defects on electrical properties of 4H-SiC Schottky diodes
Author:
Publisher
Elsevier BV
Subject
Biomaterials,Bioengineering,Mechanics of Materials
Reference15 articles.
1. Progress in silicon carbide semiconductor electronics technology
2. High-voltage Ni- and Pt-SiC Schottky diodes utilizing metal field plate termination
3. Defect Formation Mechanism of Bulk SiC
4. Raman Investigation of SiC Polytypes
5. Barrier inhomogeneities and electrical characteristics of Ti/4H-SiC Schottky rectifiers
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