Optimization of linear cell 4H-SiC power JBSFETs: Impact of N+ source contact resistance

Author:

Agarwal AditiORCID,Baliga B. Jayant

Publisher

Elsevier BV

Reference17 articles.

1. 2.3-kV, 5-A 4H-SiC Ti and Ni JBS rectifiers manufactured in commercial foundry: Impact of implant lateral straggle;Agarwal,2020

2. 2.3 kV 4H-SiC planar-gate accumulation channel power JBSFETs: Analysis of experimental data;Agarwal;IEEE J. Electron Device Society,2021

3. 650-V 4H-SiC planar inversion-channel power JBSFETs with 55-nm gate oxide: Relative performance of three cell types;Agarwal;IEEE Tram. Electron Devic,2021

4. Gallium nitride and silicon carbide power devices;Baliga,2017

5. Fundamentals of power semiconductor devices;Baliga,2019

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. TCAD-Based Investigation of a 3.3 kV Planar SiC MOSFET: BV-RON Trade-Off Optimization;2024 IEEE 18th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG);2024-06-24

2. The BiDFET Device and Its Impact on Converters;IEEE Power Electronics Magazine;2023-03

3. An Academic's Perspective on SiC Power Devices: Retrospection and Prognostication;2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA);2022-11-07

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