Novel machine learning-based prediction approach for nanoindentation load-deformation in a thin film: Applications to electronic industries-Reference-Cited by-同舟云学术

Novel machine learning-based prediction approach for nanoindentation load-deformation in a thin film: Applications to electronic industries

Published:2022-12 Issue: Volume:174 Page:108824
ISSN:0360-8352
Container-title:Computers & Industrial Engineering
language:en
Short-container-title:Computers & Industrial Engineering

Author:

Laxmikant Vajire Sujal,Prashant Singh Abhishek,Kumar Saini Dinesh,Kumar Mukhopadhyay Anoop,Singh Kulwant,Mishra Dhaneshwar

Publisher

Elsevier BV

Subject

General Engineering,General Computer Science

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