Chapter 1 Secondary Ion Mass Spectrometry (S.I.M.S.)
-
Published:1984-01
Issue:1-2
Volume:8
Page:11-57
-
ISSN:0146-3535
-
Container-title:Progress in Crystal Growth and Characterization
-
language:en
-
Short-container-title:Progress in Crystal Growth and Characterization
Author:
Stuck R.,Siffert P.
Subject
General Engineering
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Iron contamination in silicon technology;Applied Physics A: Materials Science & Processing;2000-05-01