High resolution electron microscopy of polytypes-Reference-Cited by-同舟云学术

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High resolution electron microscopy of polytypes

Published:1983-01 Issue:1-4 Volume:7 Page:343-378
ISSN:0146-3535
Container-title:Progress in Crystal Growth and Characterization
language:en
Short-container-title:Progress in Crystal Growth and Characterization

Author:

Van Landuyt J.,Van Tendeloo G.,Amelinckx S.

Publisher

Elsevier BV

Subject

General Engineering

Reference84 articles.

1. Electron Microscopy of Thin Crystals;Hirsch,1965

2. Diffraction and Imaging Techniques in Materials Science;Amelinckx,1979

3. Journal de Physique;Amelinckx,1976

4. Stacking faults in silicon carbide (6H) as observed by means of transmission electron microscopy

5. The direct observation of the structure of real crystals by lattice imaging

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Al-N-V Ternary Phase Diagram Evaluation;MSI Eureka;2017-07-13

2. Al-N Binary Phase Diagram Evaluation;MSI Eureka;2013-09-10

3. Moissanite (SiC) from kimberlites: Polytypes, trace elements, inclusions and speculations on origin;Lithos;2011-03

4. Modelling diffraction patterns from one-dimensionally disordered structures of AIIBVIcrystals by Monte Carlo Technique IV. The 6H structure with different kinds of stacking faults;Crystal Research and Technology;2010-03-08

5. Mechanical properties and microstructural analysis of a diamond-like carbon coating on an alumina/glass composite;Journal of Materials Research;1996-08

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